NISCAIR Online Periodicals Repository

Research Journals >
Indian Journal of Pure & Applied Physics (IJPAP) >
IJPAP Vol.49 [2011] >
IJPAP Vol.49(10) [October 2011] >

Title: Dual energy gamma scanning technique to analyze condition of distillation columns
Authors: Walinjkar, Parag
Singh, Gursharan
Keywords: Gamma Scanning
Dual energy
Ratio profile
Issue Date: Oct-2011
Publisher: NISCAIR-CSIR, India
Abstract: Gamma scanning technique is used for troubleshooting most of the problems of distillation columns. However, optimization of the column at design stage or during operation requires higher sensitivity, improved performance and reliability which conventional gamma scanning technique lacks to provide. The paper elaborates new approach used in gamma scanning to improve the accuracy and reliability of the technique. The results presented here are of a laboratory study carried out using two gamma ray energies and a sample column simulating problem between the tray spaces, and by scanning it using Cs-137 and Co-60 radiation sources. The raw data is then processed to obtain ratio profile of the sample column. The ratio profile is found to be more sensitive in detecting column problems. The interpretation of ratio profile appears much easier than conventional gamma profile. The laboratory study suggests that dual energy scanning technique has potential to improve the overall sensitivity and performance of the gamma scanning technique.
Page(s): 669-672
CC License:  CC Attribution-Noncommercial-No Derivative Works 2.5 India
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Source:IJPAP Vol.49(10) [October 2011]

Files in This Item:

File Description SizeFormat
IJPAP 49(10) 669-672.pdf831.73 kBAdobe PDFView/Open
 Current Page Visits: 95 
Recommend this item


Online Submission of Articles |  NISCAIR Website |  National Knowledge Resources Consortium |  Contact us |  Feedback

Disclaimer: NISCAIR assumes no responsibility for the statements and opinions advanced by contributors. The editorial staff in its work of examining papers received for publication is helped, in an honorary capacity, by many distinguished engineers and scientists.

CC License Except where otherwise noted, the Articles on this site are licensed under Creative Commons License: CC Attribution-Noncommercial-No Derivative Works 2.5 India

Copyright © 2015 The Council of Scientific and Industrial Research, New Delhi. All rights reserved.

Powered by DSpace Copyright © 2002-2007 MIT and Hewlett-Packard | Compliant to OAI-PMH V 2.0

Home Page Total Visits: 164773 since 01-Sep-2015  Last updated on 21-Jun-2016Webmaster: