Please use this identifier to cite or link to this item:
Title: Dual energy gamma scanning technique to analyze condition of distillation columns
Authors: Walinjkar, Parag
Singh, Gursharan
Keywords: Gamma Scanning
Dual energy
Ratio profile
Issue Date: Oct-2011
Publisher: NISCAIR-CSIR, India
Abstract: Gamma scanning technique is used for troubleshooting most of the problems of distillation columns. However, optimization of the column at design stage or during operation requires higher sensitivity, improved performance and reliability which conventional gamma scanning technique lacks to provide. The paper elaborates new approach used in gamma scanning to improve the accuracy and reliability of the technique. The results presented here are of a laboratory study carried out using two gamma ray energies and a sample column simulating problem between the tray spaces, and by scanning it using Cs-137 and Co-60 radiation sources. The raw data is then processed to obtain ratio profile of the sample column. The ratio profile is found to be more sensitive in detecting column problems. The interpretation of ratio profile appears much easier than conventional gamma profile. The laboratory study suggests that dual energy scanning technique has potential to improve the overall sensitivity and performance of the gamma scanning technique.
Description: 669-672
ISSN: 0975-1041 (Online); 0019-5596 (Print)
Appears in Collections:IJPAP Vol.49(10) [October 2011]

Files in This Item:
File Description SizeFormat 
IJPAP 49(10) 669-672.pdf831.73 kBAdobe PDFView/Open

Items in NOPR are protected by copyright, with all rights reserved, unless otherwise indicated.