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Title: Characterization of field grown cotton fibres using whole powder pattern fitting method
Authors: Niranjana, A R
Divakara, S
Somashekar, R
Keywords: Cotton fibres;Microstructure;Stacking fault;Twin fault;Wide angle X-ray scattering;X-ray analysis
Issue Date: Mar-2011
Publisher: NISCAIR-CSIR, India
Abstract: The quality of fibres of eight field grown cotton varieties has been quantified using wide angle X-ray scattering data. Exponential function for column length distribution has been used for the X-ray line profile analysis. The merits and demerits of cotton fibres are emphasized in terms of crystallite size, lattice strain, stacking faults and twin faults determined by the newly developed whole powder pattern fitting method. It is observed that the crystallite shape ellipse area is more in Abhadhitha cotton, which is the reason for observed high tenacity values.
Page(s): 9-17
ISSN: 0975-1025 (Online); 0971-0426 (Print)
Appears in Collections:IJFTR Vol.36(1) [March 2011]

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