NISCAIR Online Periodicals Repository

Research Journals >
Indian Journal of Biotechnology (IJBT) >
IJBT Vol.10 [2011] >
IJBT Vol.10(1) [January 2011] >

Title: Low copy number DNA typing of touched evidence by miniSTRs—A case study
Authors: Aditya, Sangeeta
Kalpana, D
Bhattacherjee, Sumita
Sharma, A K
Keywords: Fingerprints
touched evidence
Issue Date: Jan-2011
Publisher: NISCAIR-CSIR, India
Abstract: Low copy number (LCN) DNA typing is an improvised technique to obtain genetic profile from sub-optimal quantity of DNA recovered from the biological evidence samples. Minute quantity of DNA available from the touched materials sometimes fail to generate DNA profile employing conventional STR multiplexes. STRs with reduced amplicon size are a better tool for generating profile from the samples with sub-optimal quantity of DNA or environmentally challenged. In the present case study, DNA profiling of touched evidence materials is reported employing a combination of LCN typing and miniSTRs. The technology is highly valuable for increasing the scope of DNA profiling to a large number of touched evidence materials.
Page(s): 147-149
CC License:  CC Attribution-Noncommercial-No Derivative Works 2.5 India
ISSN: 0975-0967 (Online); 0972-5849 (Print)
Source:IJBT Vol.10(1) [January 2011]

Files in This Item:

File Description SizeFormat
IJBT 10(1) 147-149.pdf47.79 kBAdobe PDFView/Open
 Current Page Visits: 140 
Recommend this item


Online Submission of Articles |  NISCAIR Website |  National Knowledge Resources Consortium |  Contact us |  Feedback

Disclaimer: NISCAIR assumes no responsibility for the statements and opinions advanced by contributors. The editorial staff in its work of examining papers received for publication is helped, in an honorary capacity, by many distinguished engineers and scientists.

CC License Except where otherwise noted, the Articles on this site are licensed under Creative Commons License: CC Attribution-Noncommercial-No Derivative Works 2.5 India

Copyright © 2015 The Council of Scientific and Industrial Research, New Delhi. All rights reserved.

Powered by DSpace Copyright © 2002-2007 MIT and Hewlett-Packard | Compliant to OAI-PMH V 2.0

Home Page Total Visits: 163182 since 01-Sep-2015  Last updated on 21-Jun-2016Webmaster: