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    <title>NISCAIR Online Periodicals Repository Collection: IJPAP Vol.50(04) [April 2012]</title>
    <link>http://nopr.niscair.res.in/handle/123456789/13741</link>
    <description />
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        <rdf:li resource="http://nopr.niscair.res.in/handle/123456789/13782" />
        <rdf:li resource="http://nopr.niscair.res.in/handle/123456789/13781" />
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    <title>The Collection's search engine</title>
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    <link>http://nopr.niscair.res.in/simple-search</link>
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  <item rdf:about="http://nopr.niscair.res.in/handle/123456789/13784">
    <title>Qualitative analysis of small-signal modified Sziklai pair amplifier</title>
    <link>http://nopr.niscair.res.in/handle/123456789/13784</link>
    <description>Title: Qualitative analysis of small-signal modified Sziklai pair amplifier
&lt;br/&gt;
&lt;br/&gt;Authors: Pandey, Beena; Srivastava, Susmrita; Tiwari, Satyendra Nath; Singh, Jitendra; Shukla, Sachchida Nand
&lt;br/&gt;
&lt;br/&gt;Abstract: A small-signal&#xD;
modified Sziklai pair (complementary&#xD;
Darlington pair) amplifier is proposed with an additional biasing resistance in&#xD;
the circuit. The proposed amplifier produces significantly high voltage gain&#xD;
with narrow bandwidth. Poor response of conventional Darlington&#xD;
pair amplifiers at higher frequencies is found to be absent in the proposed&#xD;
amplifier circuit. Variations in voltage gain as a function of frequency and&#xD;
different biasing resistances, bandwidth and total harmonic distortion of the&#xD;
amplifier have also been studied. Proposed amplifier may be useful for various&#xD;
analog communication applications.
&lt;br/&gt;
&lt;br/&gt;Page(s): 272-276</description>
  </item>
  <item rdf:about="http://nopr.niscair.res.in/handle/123456789/13783">
    <title>Saturated velocity model of MESFET in the presence of interface states and interfacial layer at the gate contact</title>
    <link>http://nopr.niscair.res.in/handle/123456789/13783</link>
    <description>Title: Saturated velocity model of MESFET in the presence of interface states and interfacial layer at the gate contact
&lt;br/&gt;
&lt;br/&gt;Authors: Chattopadhyay, P; Dutta, S
&lt;br/&gt;
&lt;br/&gt;Abstract: The saturated velocity model of a short channel MESFET has been extended by&#xD;
incorporating the effects of interface states and interfacial layer at the gate&#xD;
contact of the device. Simple analytical forms for the channel current, drain&#xD;
conductance and transconductance of the device are derived and they are found&#xD;
to be much sensitive to interface state density. The proposed model has been&#xD;
applied to compare the drain characteristics of Si, SiC and GaN MESFETs. For&#xD;
all three materials, the channel current has been found to decrease with drain&#xD;
voltage as the field across the channel exceeds the critical field required for&#xD;
velocity saturation. The decrease in the drain current yields a negative drain&#xD;
conductance and transconductance with respect to drain and gate voltage,&#xD;
respectively. The experimental results reported by the earlier researchers on&#xD;
GaN and SiC MESFETs are considered to compare the theory with experiment over&#xD;
the domain of velocity saturation. It has been found that the experimental&#xD;
results can be best explained on the basis of an energy distribution of&#xD;
interface states at the gate contact of both the devices.
&lt;br/&gt;
&lt;br/&gt;Page(s): 265-271</description>
  </item>
  <item rdf:about="http://nopr.niscair.res.in/handle/123456789/13782">
    <title>Study of photoelectret effect in dysprosium doped zinc oxide</title>
    <link>http://nopr.niscair.res.in/handle/123456789/13782</link>
    <description>Title: Study of photoelectret effect in dysprosium doped zinc oxide
&lt;br/&gt;
&lt;br/&gt;Authors: Pandey, Nitin; Srivastava, Rajneesh Kumar; Prakash, S G
&lt;br/&gt;
&lt;br/&gt;Abstract: In the present work,&#xD;
photoelectret properties of ZnO and dysprosium doped ZnO have been studied.&#xD;
Dysprosium (Dy) has been mixed in ZnO by weight with varying proportion. ZnO:Dy&#xD;
(0.50%) exhibits maximum photopolarization. The variation of photoelectret&#xD;
charge with applied voltage, photopolarization time, dark depolarization time,&#xD;
intensity of illumination and wavelength of illumination has been studied. XRD&#xD;
and SEM studies show that particle size of ZnO and ZnO:Dy (0.50%) is the order&#xD;
of few hundred nano meters.
&lt;br/&gt;
&lt;br/&gt;Page(s): 260-264</description>
  </item>
  <item rdf:about="http://nopr.niscair.res.in/handle/123456789/13781">
    <title>Effect of nanocrystalline silver impregnation on mechanical properties of diamond-like-carbon films by nano-indentation</title>
    <link>http://nopr.niscair.res.in/handle/123456789/13781</link>
    <description>Title: Effect of nanocrystalline silver impregnation on mechanical properties of diamond-like-carbon films by nano-indentation
&lt;br/&gt;
&lt;br/&gt;Authors: Paul, R; Dey, A; Mukherjee, A K; Sarangi, S N; Pal, A K
&lt;br/&gt;
&lt;br/&gt;Abstract: Nano-crystalline&#xD;
silver was embedded in diamond-like-carbon films by capacitatively coupled&#xD;
plasma chemical vapour deposition. Films with different nanocrystallite sizes&#xD;
and volume fractions of silver, deposited on glass and silicon (100) substrates&#xD;
have been studied by nano-indentation to evaluate the modulation of mechanical&#xD;
properties caused by silver incorporation into the diamond-like-carbon. Raman,&#xD;
atomic force microscopy, energy dispersive X-ray studies and X-ray diffractions&#xD;
have been utilized to determine the structural properties as well as the&#xD;
bonding environment in these films. Mechanical properties have been seen to be&#xD;
modulated significantly by nanocrystalline silver incorporation.
&lt;br/&gt;
&lt;br/&gt;Page(s): 252-259</description>
  </item>
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