<?xml version="1.0" encoding="UTF-8"?>
<rdf:RDF xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns="http://purl.org/rss/1.0/" xmlns:taxo="http://purl.org/rss/1.0/modules/taxonomy/" xmlns:sy="http://purl.org/rss/1.0/modules/syndication/" xmlns:dc="http://purl.org/dc/elements/1.1/">
  <channel>
    <title>NISCAIR Online Periodicals Repository Collection: IJPAP Vol.49(07) [July 2011]</title>
    <link>http://nopr.niscair.res.in/handle/123456789/12003</link>
    <description />
    <items>
      <rdf:Seq>
        <rdf:li resource="http://nopr.niscair.res.in/handle/123456789/12012" />
        <rdf:li resource="http://nopr.niscair.res.in/handle/123456789/12011" />
        <rdf:li resource="http://nopr.niscair.res.in/handle/123456789/12010" />
        <rdf:li resource="http://nopr.niscair.res.in/handle/123456789/12009" />
      </rdf:Seq>
    </items>
  </channel>
  <textInput>
    <title>The Collection's search engine</title>
    <description>Search the Channel</description>
    <name>search</name>
    <link>http://nopr.niscair.res.in/simple-search</link>
  </textInput>
  <item rdf:about="http://nopr.niscair.res.in/handle/123456789/12012">
    <title>Current/voltage-mode third order quadrature oscillator employing two multiple outputs CCIIs and grounded capacitors</title>
    <link>http://nopr.niscair.res.in/handle/123456789/12012</link>
    <description>Title: Current/voltage-mode third order quadrature oscillator employing two multiple outputs CCIIs and grounded capacitors
&lt;br/&gt;
&lt;br/&gt;Authors: Horng, Jiun-Wei
&lt;br/&gt;
&lt;br/&gt;Abstract: A new quadrature oscillator circuit using two&#xD;
multiple outputs second-generation current conveyors (CCIIs), three grounded&#xD;
capacitors and three resistors is presented. Two high output impedance&#xD;
current-mode signals and two voltage-mode signals each pair with 90° phase difference are available in the proposed circuit. The&#xD;
oscillation condition and oscillation frequency are independently controllable&#xD;
through grounded resistors. The use of only grounded capacitors makes the&#xD;
proposed circuit attractive for integrated circuit implementation.
&lt;br/&gt;
&lt;br/&gt;Page(s): 494-498</description>
  </item>
  <item rdf:about="http://nopr.niscair.res.in/handle/123456789/12011">
    <title>Charge generation and photovoltaic properties of thin film device based on pyronine G:zinc oxide composite</title>
    <link>http://nopr.niscair.res.in/handle/123456789/12011</link>
    <description>Title: Charge generation and photovoltaic properties of thin film device based on pyronine G:zinc oxide composite
&lt;br/&gt;
&lt;br/&gt;Authors: Rajkumar; Sharma, G D; Roy, M S
&lt;br/&gt;
&lt;br/&gt;Abstract: The&#xD;
electrical and photoelectrical properties of thin film hybrid blend device&#xD;
consisting of nanocrystalline inorganic semiconductor zinc oxide (ZnO) and pyronine&#xD;
G (PYR G) (an organic &lt;i&gt;p&lt;/i&gt;-type&#xD;
semiconductor) have been studied through recorded fluorescence (FL) spectra,&#xD;
current-voltage characteristics (in dark and under illumination) and photo-action&#xD;
spectra of device. The quenching of FL spectra of PYR G when mixed with ZnO has&#xD;
been interpreted in terms of efficient electron transfer between PYR G (donor)&#xD;
and ZnO (acceptor) on photoexcitation. The observed results justify the&#xD;
formation of bulk heterojunction between PYR G and ZnO, sandwiched between Al&#xD;
and ITO electrodes. The nearly linear dependence of photocurrent with incident&#xD;
light intensity suggests the efficient photo-induced charge-transfer in the&#xD;
device consisting of PYR G:ZnO restricting charge recombination comparatively&#xD;
to device based on pure PYR G. The absorption spectra of the blend suggest the&#xD;
formation of hetero-junction and there is no ground state doping.
&lt;br/&gt;
&lt;br/&gt;Page(s): 489-493</description>
  </item>
  <item rdf:about="http://nopr.niscair.res.in/handle/123456789/12010">
    <title>Role of Sn incorporation in the dielectric properties of Se&lt;sub&gt;75&lt;/sub&gt;Te&lt;sub&gt;25&lt;/sub&gt; and Se&lt;sub&gt;85&lt;/sub&gt;Te&lt;sub&gt;15&lt;/sub&gt; glassy alloys</title>
    <link>http://nopr.niscair.res.in/handle/123456789/12010</link>
    <description>Title: Role of Sn incorporation in the dielectric properties of Se&lt;sub&gt;75&lt;/sub&gt;Te&lt;sub&gt;25&lt;/sub&gt; and Se&lt;sub&gt;85&lt;/sub&gt;Te&lt;sub&gt;15&lt;/sub&gt; glassy alloys
&lt;br/&gt;
&lt;br/&gt;Authors: Sharma, J; Kumar, S
&lt;br/&gt;
&lt;br/&gt;Abstract: The effect of Sn&#xD;
incorporation in the dielectric properties of two binary Se-Te glassy systems,&#xD;
comparing the properties of a-Se&lt;sub&gt;75&lt;/sub&gt;Te&lt;sub&gt;25&lt;/sub&gt;, a-Se&lt;sub&gt;85&lt;/sub&gt;Te&lt;sub&gt;15&lt;/sub&gt;&#xD;
and a-Se&lt;sub&gt;75&lt;/sub&gt;Te&lt;sub&gt;15&lt;/sub&gt;Sn&lt;sub&gt;10&lt;/sub&gt; glassy alloys, has been&#xD;
studied. The temperature and frequency&#xD;
dependence of the dielectric constants and the dielectric losses in glassy&#xD;
Se&lt;sub&gt;75&lt;/sub&gt;Te&lt;sub&gt;25, &lt;/sub&gt;Se&lt;sub&gt;85&lt;/sub&gt;Te&lt;sub&gt;&#xD;
15 &lt;/sub&gt;and Se&lt;sub&gt;75&lt;/sub&gt;Te&lt;sub&gt;15&lt;/sub&gt;Sn&lt;sub&gt;10 &lt;/sub&gt;alloys has been&#xD;
studied by measuring capacitance and dissipation factor in the frequency range&#xD;
1 kHz-5 MHz and temperature range 300-350 K. A Debye like relaxation of&#xD;
dielectric behaviour has been observed. A detailed analysis shows that the&#xD;
observed dielectric loss is in agreement with the Guintini’s theory of&#xD;
dielectric dispersion based on two electron hopping over a potential barrier&#xD;
and is applicable in the present case. Dielectric constant (&lt;img src='http://www.niscair.res.in/jinfo/epsilon-dash1.gif' border=0&gt;),&#xD;
dielectric loss (&lt;img src='http://www.niscair.res.in/jinfo/epsilon-dash2.gif' border=0&gt;) and loss tangent (tan&lt;img src='/image/spc_char/delta1.gif' border=0&gt;),&#xD;
are found to be highly frequency and temperature dependent. Dependence of these&#xD;
dielectric parameters over the metallic impurity Sn has also been found in the&#xD;
present glassy system. It is observed that &lt;img src='http://www.niscair.res.in/jinfo/epsilon-dash1.gif' border=0&gt;as well as &lt;img src='http://www.niscair.res.in/jinfo/epsilon-dash2.gif' border=0&gt;, both&#xD;
decrease when Sn is incorporated in binary Se&lt;sub&gt;75&lt;/sub&gt;Te&lt;sub&gt;25 &lt;/sub&gt;and&#xD;
Se&lt;sub&gt;85&lt;/sub&gt;Te&lt;sub&gt;15&lt;/sub&gt; glassy systems. The peculiar role of the third&#xD;
element Sn as an impurity is also discussed in terms of electronegativity&#xD;
difference between the elements used in making the aforesaid glassy system.
&lt;br/&gt;
&lt;br/&gt;Page(s): 483-488</description>
  </item>
  <item rdf:about="http://nopr.niscair.res.in/handle/123456789/12009">
    <title>Study of heterogeneous interaction through dielectric properties of  binary mixtures of fluorobenzene with methanol</title>
    <link>http://nopr.niscair.res.in/handle/123456789/12009</link>
    <description>Title: Study of heterogeneous interaction through dielectric properties of  binary mixtures of fluorobenzene with methanol
&lt;br/&gt;
&lt;br/&gt;Authors: Prajapati, A N; Rana, V A; Vyas, A D; Bhatnagar, S P
&lt;br/&gt;
&lt;br/&gt;Abstract: Complex permittivity&#xD;
of mixtures of fluorobenzene (FB) and methanol (MeOH) over a wide range of&#xD;
concentration (0.0-1.0) has been measured at various temperatures. Vector&#xD;
network analyzer (VNA) operating in the frequency range &#xD;
0.3 MHz-3.0 GHz is used to obtain complex permittivity spectra of the liquid&#xD;
samples. Complex permittivity of these samples at two spot frequencies 9.1 and&#xD;
19.61 GHz is also measured using standard microwave benches. Measured values of&#xD;
the dielectric loss (&lt;img src='http://www.niscair.res.in/jinfo/epsilon-dash2.gif' border=0&gt;) have&#xD;
been plotted against dielectric constant (&lt;img src='http://www.niscair.res.in/jinfo/epsilon-dash1.gif' border=0&gt;) in a complex plane for MeOH, FB and their mixtures. Various&#xD;
dielectric parameters like relaxation time (&lt;img src='/image/spc_char/tow.gif' border=0&gt;&lt;sub&gt;0&lt;/sub&gt;), static dielectric constant (ε&lt;sub&gt;0&lt;/sub&gt;)&lt;sub&gt;&#xD;
&lt;/sub&gt;and high frequency limiting dielectric constant (&lt;img src='http://www.niscair.res.in/jinfo/infi.gif' border=0&gt;) have been obtained from these&#xD;
curves. Obtained dielectric parameters are used to evaluate Kirkwood&#xD;
correlation factor (&lt;i style=""&gt;g&lt;/i&gt;), Bruggeman&#xD;
parameter (&lt;i style=""&gt;f&lt;sub&gt;B&lt;/sub&gt;&lt;/i&gt;) and&#xD;
thermodynamic parameters. These parameters have been interpreted in terms of&#xD;
molecular interaction between the different molecular species of the liquid&#xD;
mixtures.
&lt;br/&gt;
&lt;br/&gt;Page(s): 478-482</description>
  </item>
</rdf:RDF>

