Browsing by Subject D-band
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| Title | Author(s) | Source | Page(s) |
|---|---|---|---|
| Determination of defect density, crystallite size and number of graphene layers in graphene analogues using X-ray diffraction and Raman spectroscopy | Sharma, Rahul; Chadha, Neakanshika; Saini, Parveen | IJPAP Vol.55(09) [September 2017] | 625-629 |