Browsing by Author Jun, Chen

Jump to: 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
or enter first few letters:  
Showing results 1 to 1 of 1
Measurement of novel micro bulk defects in semiconductive materials based on Mie scatterZheng, You; Yingpeng, Li; Jun, ChenIJPAP Vol.45(4) [April 2007]372-376